EMC-Test-Device for IO-Link


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MPN: 407

Manufacturer: TEConcept GmbH

Delivery: Ships within 7-14 business days
Qualifies for Free shipping to the US

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Product Information

Product Description

The device generates an 8-bit random number which is read out by the master. During the test, the master should return this random number to the device in the next IO-Link cycle.

The device checks whether it receives the correct random number and then, increments an internal error counter if not. The error counter is also incremented if a checksum error or a parity error is detected on the device side.

The error count can be read out by the master via an IO-Link parameter after the test. In addition, the error counter value is also displayed by a 7-segment indicator.

When an error is detected the device generates a trigger signal at an optical output. A trigger box that converts the optical signal into a trigger pulse can be connected to the device. The trigger pulse supports developers in identifying possible issues on the master side.

The device can be configured by DIP-Switches to operate in one of 3 COM-speeds.


  • Device fully compliant to V1.1.2 IO-Link Interface Specification
  • All 3 COM-Speeds supported (Switch Selector)
  • Internal Pseudo-Random-Number Generators
  • Error counter for Parity, Checksum, Data and Time-out Errors
  • 7-Segment Error Counter Display
  • 7-Segment Device Status Display
  • Errors Counter accessible via IO-Link
  • Optical Error Trigger Output

Documents and Drivers


EMC-Test-Device for IO-Link Datasheet



  • 7-Segment Error Counter Display
  • 7-Segment Device Status Display


Optical Error Trigger Output



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