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EMC-Test-Device for IO-Link

SKU GC-TEC-IOLD-EMC

MPN ITH-CTE-EMCTDFSML

Stock Status: Out of Stock In Stock

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Description

The device generates an 8-bit random number which is read out by the master. During the test, the master should return this random number to the device in the next IO-Link cycle.

The device checks whether it receives the correct random number and then, increments an internal error counter if not. The error counter is also incremented if a checksum error or a parity error is detected on the device side.

The error count can be read out by the master via an IO-Link parameter after the test. In addition, the error counter value is also displayed by a 7-segment indicator.

When an error is detected the device generates a trigger signal at an optical output. A trigger box that converts the optical signal into a trigger pulse can be connected to the device. The trigger pulse supports developers in identifying possible issues on the master side.

The device can be configured by DIP-Switches to operate in one of 3 COM-speeds.

Features
Documents & Drivers
Specs

Delivery: Ships within
5 to 7 business days

Availability: in stock

30 day Money Back Guarantee *Some Exceptions Apply

Warranty: 1 year Comprehensive support for all products

Support

We have the best technical support engineers that know how to use our products. If our Tech Support cannot solve your problem, we will contact the design engineer or manufacturer to help find a resolution.