EMC-Test-Device for IO-Link

EMC-Test-Device for IO-Link
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EMC-Test-Device for IO-Link
$7,900.00
SKU: GC-TEC-IOLD-EMC
MPN: ITH-CTE-EMCTDFSML
Manufacturer: TEConcept
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Product Information
Product Description
The device generates an 8-bit random number which is read out by the master. During the test, the master should return this random number to the device in the next IO-Link cycle.
The device checks whether it receives the correct random number and then, increments an internal error counter if not. The error counter is also incremented if a checksum error or a parity error is detected on the device side.
The error count can be read out by the master via an IO-Link parameter after the test. In addition, the error counter value is also displayed by a 7-segment indicator.
When an error is detected the device generates a trigger signal at an optical output. A trigger box that converts the optical signal into a trigger pulse can be connected to the device. The trigger pulse supports developers in identifying possible issues on the master side.
The device can be configured by DIP-Switches to operate in one of 3 COM-speeds.
Features
- Device fully compliant to V1.1.2 IO-Link Interface Specification
- All 3 COM-Speeds supported (Switch Selector)
- Internal Pseudo-Random-Number Generators
- Error counter for Parity, Checksum, Data and Time-out Errors
- 7-Segment Error Counter Display
- 7-Segment Device Status Display
- Errors Counter accessible via IO-Link
- Optical Error Trigger Output
Documents and Drivers
Documentation
EMC-Test-Device for IO-Link Datasheet
Specifications
Display
- 7-Segment Error Counter Display
- 7-Segment Device Status Display
Input/Output
Optical Error Trigger Output
MPN
ITH-CTE-EMCTDFSML
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