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EMC-Test-Master for IO-Link

SKU GC-TEC-IOLM-EMC

MPN ITH-CTE-EMCTMML

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Description

The IO-Link specification has well defined procedures to test the EMC robustness of IO-Link devices.

Some tests check the sensitivity of the IO-Link communication of IO-Link devices under EMC conditions. This test requires a robust master that is much less sensitive to EMC noise than the device under test.

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Delivery: Usually ships in 5-7 business days

Availability: in stock

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