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EMC-Test-Master for IO-Link



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The IO-Link specification has well defined procedures to test the EMC robustness of IO-Link devices.

Some tests check the sensitivity of the IO-Link communication of IO-Link devices under EMC conditions. This test requires a robust master that is much less sensitive to EMC noise than the device under test.

This requirement is achieved by separating the IO-Link master into two parts:

  • part 1 contains the sensitive digital logic (µC- box)
  • part 2 contains the IO-Link transceiver (PHY-box)

Both parts are separated by an optical connection with a length of up to 10m.

    Documents & Drivers

    Delivery: Usually ships in 5-7 business days

    Availability: in stock

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